Neo TH7

NEO CP-TH7 is the latest X-ray fluorescence spectrometer launched by CIPU Technology, mainly designed for analyzing and detecting the thickness of multi-layer complex coatings on hardware components, electronic conductive communication parts, plastic shell electroplated parts, automotive components and connectors, cables, etc.
NEO CP-TH7 uses a semiconductor detector, which can be configured with a Si-PIN or SDD detector. It adopts 0.1-1 mm multi-aperture collimators, suitable for detecting the electroplating thickness of small local areas of various components and the proportional detection of electroplating element composition.

A top-illuminated electroplating coating thickness detector with a detection limit of 0.001 µm and a detection accuracy of RSD < 1%. It can be configured with an SOD high-resolution thickness gauge.
Equipped with a 12-megapixel high-definition camera to easily distinguish the test area.
Manual adjustment of the XY platform for easy positioning of the test area.

Multi-layer coating detection: Detection layer range 1-5 layers; detection range of element content in plating solution 1 ppm - 99.99%.
Mobile platform range 160 x 160mm, sample chamber height 120mm, cross hair positioning.
Detected coating types: metal electroplating coatings, plastic electroplating coatings, electroplating solution liquids.

Adopts multi-modal MultiRay-FP testing algorithm, with measurement accuracy and stability fluctuating in thousandths. Multiple repeated tests can be set, and relevant statistical data can be displayed: maximum value, minimum value, average value, relative standard deviation (RSD), etc.
For alloy substrates/composite coatings, in addition to detecting coating thickness, it can display the composition ratio between elements, atomic percentage, or mass percentage.
Diverse settings for print reports, classified storage, and printing of test records by different operators.